Dr. Ritu Saini
Double board-certified dermatologist in NYC
A native New Yorker, Dr. Ritu Saini received her medical degree with an honors distinction in biochemistry at the New York University School of Medicine after graduating magna cum laude from the University of Pennsylvania.
She then went on to complete a dermatology residency at the Department of Dermatology and Cutaneous Surgery at the University of Miami Miller School of Medicine. A board certified dermatologist, specializing in Mohs micrographic surgery, cosmetic dermatology, dermatologic and laser surgery, Dr. Saini obtained a dermatologic surgery fellowship under the direction of world-renowned Mohs micrographic surgeon, Dr. Perry Robins.
Dr. Saini is a fellow of the American Academy of Dermatology and a member of many medical societies including the American College of Mohs Surgery, the American Society for Dermatologic Surgery and the American Society of Laser Medicine and Surgery. She also currently holds a highly regarded position, as the Director of Dermatological Surgery for St. John’s Episcopal Hospital’s dermatology research program, in Far Rockaway, New York.
Throughout the years, Dr. Saini has also been published in many peer-reviewed journals and currently serves on the Medical Editorial Review Board for the Journal of Drugs in Dermatology. She has lectured both nationally and internationally, and has made several media appearances as a spokesperson for the Skin Cancer Foundation. She is considered a world-renowned expert in the treatment of cutaneous cancer, as well as the aging face and body. Dr. Saini attends medical conferences and trainings throughout the world to implement the newest techniques for her patients. In addition, she is known for her advanced expertise in hair loss using the latest innovative topical, systemic, and procedural treatments.
Dr. Saini also spends time as a Clinical Assistant Professor at the prestigious New York University’s Department of Dermatology and enjoys teaching dermatology residents and medical students.